et. al., Dr. K. Mohan Prasad,. “A Robustand Dynamic Fault Detectionand Classficationof Semi-Conductorsusing Logistic Regression”. Turkish Journal of Computer and Mathematics Education (TURCOMAT) 12, no. 10 (April 28, 2021): 5911–5914. Accessed May 2, 2024. https://www.turcomat.org/index.php/turkbilmat/article/view/5411.