et. al., D. K. M. P. . “A Robustand Dynamic Fault Detectionand Classficationof Semi-Conductorsusing Logistic Regression”. Turkish Journal of Computer and Mathematics Education (TURCOMAT), vol. 12, no. 10, Apr. 2021, pp. 5911-4, doi:10.17762/turcomat.v12i10.5411.