ET. AL., D. K. M. P. . A Robustand Dynamic Fault Detectionand Classficationof Semi-Conductorsusing Logistic Regression. Turkish Journal of Computer and Mathematics Education (TURCOMAT), [S. l.], v. 12, n. 10, p. 5911–5914, 2021. DOI: 10.17762/turcomat.v12i10.5411. Disponível em: https://www.turcomat.org/index.php/turkbilmat/article/view/5411. Acesso em: 2 may. 2024.